Crystallography and Composition Core (CEC)
Defining crystal structures and elemental composition with precision X-ray and elemental analysis tools.
Description: Provides atomic and molecular-level structural and compositional analysis of materials.
Facilities and Instruments:
- Crystallography Facility → Rigaku SuperNova Hypix 6000 Single Crystal X-Ray Diffractometer (SCXRD), Rigaku SmartLab (for powder and thin films) X-Ray Diffractometer (XRD)
- Elemental Analysis Facility → Epsilon 4 Benchtop X-Ray Fluorescence Spectrometer (XRF, planned Dec 2025), PerkinElmer Optima 8000 (equipped with multisampler) Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES)
Capabilities: Supports single-crystal structure determination, powder diffraction for phase identification, non-destructive elemental composition analysis via XRF, and sensitive elemental quantification through ICP-OES.
Rates per hour:
| Non-Academic Users | ||||
| Instrument | Internal | External | Training Fee per session | |
| SCXRD | $100 | $150 | $120 | |
| XRD | $90 | $140 | $120 | |
| XPS | $200 | $250 | – | |
| XRF | $80 | $120 | $100 | |
| ICP-OES | $140 | $180 | $120 | |
Rates per sample can be provided as requested.